Two scanning electron microscopes (SEM)

Beskrivning

The Department of Microtechnology and Nanoscience is procuring two scanning electron microscopes. A high-end microscope capable of sub-nm resolution even at extremely low voltages (1kV and below), to image the most challenging samples. And a mid-range microscope with nm resolution for routine measurements. These complementary systems will be used to address the morphology and surface characteristics of fabricated nanodevices.